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"Image processing through multiscale analysis and measurement noise modeling."

Fionn Murtagh, Jean-Luc Starck (2000)

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DOI: 10.1023/A:1008938224840

access: closed

type: Journal Article

metadata version: 2020-03-25

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Fionn Murtagh, Jean-Luc Starck:
Image processing through multiscale analysis and measurement noise modeling. Stat. Comput. 10(2): 95-103 (2000)

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