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"Optimal design of simple step-stress accelerated life tests for one-shot ..."

Man Ho Ling, X. W. Hu (2020)

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DOI: 10.1016/J.RESS.2019.106630

access: closed

type: Journal Article

metadata version: 2022-12-09

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Man Ho Ling, X. W. Hu:
Optimal design of simple step-stress accelerated life tests for one-shot devices under Weibull distributions. Reliab. Eng. Syst. Saf. 193: 106630 (2020)

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