"Computation of joint reliability importance of two gate events in a fault ..."

Jung-Sik Hong, Hye-Young Koo, Chang-Hoon Lie (2000)

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DOI: 10.1016/S0951-8320(99)00079-4

access: closed

type: Journal Article

metadata version: 2020-02-25

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Jung-Sik Hong, Hye-Young Koo, Chang-Hoon Lie:
Computation of joint reliability importance of two gate events in a fault tree. Reliab. Eng. Syst. Saf. 68(1): 1-5 (2000)

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