"EM algorithm for one-shot device testing with competing risks under ..."

Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling (2015)

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DOI: 10.1016/J.RESS.2014.12.014

access: closed

type: Journal Article

metadata version: 2020-02-25

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Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling:
EM algorithm for one-shot device testing with competing risks under exponential distribution. Reliab. Eng. Syst. Saf. 137: 129-140 (2015)

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