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"Reliability Modeling for Ultrathin Gate Oxides Subject to Logistic ..."
Hao Peng, Qianmei Feng (2013)
- Hao Peng, Qianmei Feng:
Reliability Modeling for Ultrathin Gate Oxides Subject to Logistic Degradation Processes with Random Onset Time. Qual. Reliab. Eng. Int. 29(5): 709-718 (2013)
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