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"A quantile-quantile plot based pattern matching for defect detection."

Du-Ming Tsai, Cheng-Hsiang Yang (2005)

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DOI: 10.1016/J.PATREC.2005.02.002

access: closed

type: Journal Article

metadata version: 2020-02-22

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Du-Ming Tsai, Cheng-Hsiang Yang:
A quantile-quantile plot based pattern matching for defect detection. Pattern Recognit. Lett. 26(13): 1949-1962 (2005)

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