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"Combined blur and affine moment invariants and their use in pattern ..."

Tomás Suk, Jan Flusser (2003)

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DOI: 10.1016/S0031-3203(03)00187-0

access: closed

type: Journal Article

metadata version: 2020-09-05

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Tomás Suk, Jan Flusser:
Combined blur and affine moment invariants and their use in pattern recognition. Pattern Recognit. 36(12): 2895-2907 (2003)

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