"Successive pattern classification based on test feature classifier and its ..."

Yukinobu Sakata et al. (2005)

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DOI: 10.1016/J.PATCOG.2005.04.013

access: closed

type: Journal Article

metadata version: 2020-02-24

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Yukinobu Sakata, Shun'ichi Kaneko, Yuji Takagi, Hirohito Okuda:
Successive pattern classification based on test feature classifier and its application to defect image classification. Pattern Recognit. 38(11): 1847-1856 (2005)

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