"Motif-based defect detection for patterned fabric."

Henry Y. T. Ngan, Grantham K. H. Pang, Nelson H. C. Yung (2008)

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DOI: 10.1016/J.PATCOG.2007.11.014

access: closed

type: Journal Article

metadata version: 2023-07-24

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Henry Y. T. Ngan, Grantham K. H. Pang, Nelson H. C. Yung:
Motif-based defect detection for patterned fabric. Pattern Recognit. 41(6): 1878-1894 (2008)

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