"Soft-error filtering: A solution to the reliability problem of future VLSI ..."

Yvon Savaria et al. (1986)

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DOI: 10.1109/PROC.1986.13530

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type: Journal Article

metadata version: 2022-08-25

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Yvon Savaria, Nicholas C. Rumin, Jeremiah F. Hayes, Vinold K. Agarwal:
Soft-error filtering: A solution to the reliability problem of future VLSI digital circuits. Proc. IEEE 74(5): 669-683 (1986)

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