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"Defect identification of bare printed circuit boards based on Bayesian ..."

Xixi Han et al. (2024)

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DOI: 10.7717/PEERJ-CS.1900

access: open

type: Journal Article

metadata version: 2024-03-26

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Xixi Han, Renpeng Li, Boqin Wang, Zhibo Lin:
Defect identification of bare printed circuit boards based on Bayesian fusion of multi-scale features. PeerJ Comput. Sci. 10: e1900 (2024)

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