"Simulation Design for Security Testing of Integrated Electronic Systems."

Daojing He et al. (2020)

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DOI: 10.1109/MNET.2019.1900196

access: closed

type: Journal Article

metadata version: 2024-05-07

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Daojing He, Qi Qiao, Jiahao Gao, Sammy Chan, Kangfeng Zheng, Nadra Guizani:
Simulation Design for Security Testing of Integrated Electronic Systems. IEEE Netw. 34(1): 159-165 (2020)

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