"Defect count prediction via metric-based convolutional neural network."

Meetesh Nevendra, Pradeep Singh (2021)

> Home

Details and statistics

DOI: 10.1007/S00521-021-06158-5

access: closed

type: Journal Article

metadata version: 2023-03-14

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/nca/NevendraS21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/nca/NevendraS21
Meetesh Nevendra, Pradeep Singh:
Defect count prediction via metric-based convolutional neural network. Neural Comput. Appl. 33(22): 15319-15344 (2021)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.