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"Improved segmentation of semiconductor defects using area sieves."

N. G. Shankar, Z. W. Zhong (2006)

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DOI: 10.1007/S00138-005-0004-0

access: closed

type: Journal Article

metadata version: 2020-11-25

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  - https://dblp.org/rec/journals/mva/ShankarZ06
N. G. Shankar, Z. W. Zhong:
Improved segmentation of semiconductor defects using area sieves. Mach. Vis. Appl. 17(1): 1-7 (2006)

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