"Valid-IoU: an improved IoU-based loss function and its application to ..."

Elnaz Vakili et al. (2025)

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DOI: 10.1007/S11042-024-19482-4

access: closed

type: Journal Article

metadata version: 2025-05-31

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Elnaz Vakili, Ghader Karimian, Maryam Shoaran, Reza Yadipour, Jafar Sobhi:
Valid-IoU: an improved IoU-based loss function and its application to detection of defects on printed circuit boards. Multim. Tools Appl. 84(14): 13905-13928 (2025)

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