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"Transient dual interface measurement of junction-to-case thermal ..."
Yuwei Zhai et al. (2016)
- Yuwei Zhai, Faguo Liang, Chunsheng Guo, Yan Liu:
Transient dual interface measurement of junction-to-case thermal resistance in AlGaN/GaN HEMT utilizing an improved infrared microscope. Microelectron. Reliab. 66: 52-57 (2016)
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