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"High field stress at and above room temperature in 2.3 nm thick oxides."

Damien Zander et al. (2001)

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DOI: 10.1016/S0026-2714(01)00062-2

access: closed

type: Journal Article

metadata version: 2022-06-17

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  - https://dblp.org/rec/journals/mr/ZanderPSM01
Damien Zander, Christian Petit, F. Saigné, A. Meinertzhagen:
High field stress at and above room temperature in 2.3 nm thick oxides. Microelectron. Reliab. 41(7): 1023-1026 (2001)

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