BibTeX record journals/mr/YuYX06

download as .bib file

@article{DBLP:journals/mr/YuYX06,
  author    = {Chuanzhao Yu and
               J. S. Yuan and
               Enjun Xiao},
  title     = {Dynamic voltage stress effects on nMOS varactor},
  journal   = {Microelectron. Reliab.},
  volume    = {46},
  number    = {9-11},
  pages     = {1812--1816},
  year      = {2006},
  url       = {https://doi.org/10.1016/j.microrel.2006.07.075},
  doi       = {10.1016/j.microrel.2006.07.075},
  timestamp = {Sat, 22 Feb 2020 19:28:11 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/YuYX06.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of Schloss Dagstuhl - Leibniz Center for Informatics