BibTeX record journals/mr/YuYS05

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@article{DBLP:journals/mr/YuYS05,
  author    = {Chuanzhao Yu and
               J. S. Yuan and
               Anwar Sadat},
  title     = {Dynamic stress-induced high-frequency noise degradations in nMOSFETs},
  journal   = {Microelectron. Reliab.},
  volume    = {45},
  number    = {9-11},
  pages     = {1794--1799},
  year      = {2005},
  url       = {https://doi.org/10.1016/j.microrel.2005.07.096},
  doi       = {10.1016/j.microrel.2005.07.096},
  timestamp = {Sat, 22 Feb 2020 19:29:19 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/YuYS05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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