Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"RF stress effects on CMOS LC-loaded VCO reliability evaluated by experiments."

H. D. Yen et al. (2012)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2012.04.007

access: closed

type: Journal Article

metadata version: 2024-01-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/YenYWHYH12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/YenYWHYH12
H. D. Yen, Jiann-Shiun Yuan, Ruey-Lue Wang, G. W. Huang, W. K. Yeh, F. S. Huang:
RF stress effects on CMOS LC-loaded VCO reliability evaluated by experiments. Microelectron. Reliab. 52(11): 2655-2659 (2012)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.