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"High resolution AFM scanning Moiré method and its application to ..."

Huimin Xie et al. (2002)

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DOI: 10.1016/S0026-2714(02)00084-7

access: closed

type: Journal Article

metadata version: 2020-10-26

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Huimin Xie, Anand K. Asundi, Chai Gin Boay, Lu Yunguang, Jin Yu, Zhaowei Zhong, Bryan K. A. Ngoi:
High resolution AFM scanning Moiré method and its application to the micro-deformation in the BGA electronic package. Microelectron. Reliab. 42(8): 1219-1227 (2002)

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