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"Test methodology of a new upset mechanism induced by protons in deep ..."
Cécile Weulersse et al. (2012)
- Cécile Weulersse, Florent Miller, Dan Alexandrescu, Erwin Schaefer, Olivier Crépel, Rémi Gaillard:
Test methodology of a new upset mechanism induced by protons in deep sub-micron devices. Microelectron. Reliab. 52(9-10): 2482-2486 (2012)
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