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"Influence of surface states on the voltage robustness of AlGaN/GaN HFET ..."

Matthias Wespel et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.09.016

access: closed

type: Journal Article

metadata version: 2021-10-14

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Matthias Wespel, Martina Baeumler, Vladimir Polyakov, Maximilian Dammann, Richard Reiner, Patrick Waltereit, Rüdiger Quay, Michael Mikulla, Oliver Ambacher:
Influence of surface states on the voltage robustness of AlGaN/GaN HFET power devices. Microelectron. Reliab. 54(12): 2656-2661 (2014)

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