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"Corrigendum to "A subgap density of states modeling for the transient ..."

Weiliang Wang et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.09.003

access: closed

type: Journal Article

metadata version: 2020-02-22

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Weiliang Wang, Karim Khan, Xingye Zhang, Haiming Qin, Jun Jiang, Lijing Miao, Kemin Jiang, Pengjun Wang, Mingzhi Dai, Junhao Chu:
Corrigendum to "A subgap density of states modeling for the transient characteristics in oxide-based thin-film transistors" [Microelectron. Reliab. 60 (2016) 67-69]. Microelectron. Reliab. 67: 159 (2016)

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