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"Electrical properties of carbon nanotube via interconnects for 30 nm ..."

Anshul A. Vyas et al. (2016)

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DOI: 10.1016/J.MICROREL.2015.10.019

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/VyasZWWY16
Anshul A. Vyas, Changjian Zhou, Patrick Wilhite, Phillip Wang, Cary Y. Yang:
Electrical properties of carbon nanotube via interconnects for 30 nm linewidth and beyond. Microelectron. Reliab. 61: 35-42 (2016)

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