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"The Reliability of New Generation Power MOSFETs in Radiation Environment."

Francesco Velardi et al. (2002)

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DOI: 10.1016/S0026-2714(02)00202-0

access: closed

type: Journal Article

metadata version: 2020-02-22

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Francesco Velardi, Francesco Iannuzzo, Giovanni Busatto, Jeffery Wyss, A. Kaminksy:
The Reliability of New Generation Power MOSFETs in Radiation Environment. Microelectron. Reliab. 42(9-11): 1629-1634 (2002)

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