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"Qualification extension of automotive smart power and digital ICs to harsh ..."

Riccardo Enrici Vaion et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.07.061

access: closed

type: Journal Article

metadata version: 2023-03-21

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Riccardo Enrici Vaion, Matteo Medda, Alberto Mancaleoni, Giovanna Mura, A. Pintus, M. De Tomasi:
Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities. Microelectron. Reliab. 76-77: 438-443 (2017)

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