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"Thermal stress probing the channel-length modulation effect of nano n-type ..."
Fu-Yuan Tuan et al. (2018)
- Fu-Yuan Tuan, Chii-Wen Chen, Mu-Chun Wang
, Wen-Shiang Liao, Shea-Jue Wang, Shou-Kong Fan, Wen-How Lan:
Thermal stress probing the channel-length modulation effect of nano n-type FinFETs. Microelectron. Reliab. 83: 260-270 (2018)
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