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"Some practical considerations for effective and efficient wafer-level ..."

Summer F. C. Tseng et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.04.009

access: closed

type: Journal Article

metadata version: 2020-02-22

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Summer F. C. Tseng, Wei-Ting Kary Chien, Excimer Gong, Willings Wang, Bing-Chu Cai:
Some practical considerations for effective and efficient wafer-level reliability control. Microelectron. Reliab. 44(8): 1233-1243 (2004)

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