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"Predicting the process induced warpage of electronic packages using the ..."
Shiang-Yu Teng, Sheng-Jye Hwang (2007)
- Shiang-Yu Teng, Sheng-Jye Hwang:
Predicting the process induced warpage of electronic packages using the P-V-T-C equation and the Taguchi method. Microelectron. Reliab. 47(12): 2231-2241 (2007)
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