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"The role of surface barrier oxidation on AlGaN/GaN HEMTs reliability."

Milan Tapajna et al. (2012)

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DOI: 10.1016/J.MICROREL.2011.09.009

access: closed

type: Journal Article

metadata version: 2020-09-05

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  - https://dblp.org/rec/journals/mr/TapajnaKCJK12
Milan Tapajna, Nicole Killat, Uttiya Chowdhury, Jose L. Jimenez, Martin Kuball:
The role of surface barrier oxidation on AlGaN/GaN HEMTs reliability. Microelectron. Reliab. 52(1): 29-32 (2012)

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