"Investigation of the hot carrier degradation in power LDMOS transistors ..."

Andrea Natale Tallarico et al. (2017)

Details and statistics

DOI: 10.1016/J.MICROREL.2017.07.043

access: closed

type: Journal Article

metadata version: 2021-05-07

a service of  Schloss Dagstuhl - Leibniz Center for Informatics