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"Reliability issues of silicon LSIs facing 100-nm technology node."

Eiji Takeda et al. (2002)

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DOI: 10.1016/S0026-2714(02)00029-X

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/TakedaMTOEHK02
Eiji Takeda, Eiichi Murakami, Kazuyoshi Torii, Yutaka Okuyama, Eishi Ebe, Kenji Hinode, Shin'ichiro Kimura:
Reliability issues of silicon LSIs facing 100-nm technology node. Microelectron. Reliab. 42(4-5): 493-506 (2002)

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