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"Effects of high electric field and elevated-temperature bias stressing on ..."
Ninoslav Stojadinovic et al. (2002)
- Ninoslav Stojadinovic, Ivica Manic, Snezana Djoric-Veljkovic
, Vojkan Davidovic
, Snezana Golubovic, Sima Dimitrijev
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Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs. Microelectron. Reliab. 42(4-5): 669-677 (2002)
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