"Negative bias temperature instability mechanisms in p-channel power VDMOSFETs."

Ninoslav Stojadinovic et al. (2005)

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DOI: 10.1016/J.MICROREL.2005.07.018

access: closed

type: Journal Article

metadata version: 2024-02-05

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Ninoslav Stojadinovic, Danijel Dankovic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Ivica Manic, Snezana Golubovic:
Negative bias temperature instability mechanisms in p-channel power VDMOSFETs. Microelectron. Reliab. 45(9-11): 1343-1348 (2005)

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