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"A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications."
A. Sozza et al. (2005)
- A. Sozza
, Christian Dua, Erwan Morvan, Bertrand Grimbert, Sylvain L. Delage:
A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications. Microelectron. Reliab. 45(9-11): 1617-1621 (2005)

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