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"A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications."

A. Sozza et al. (2005)

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DOI: 10.1016/J.MICROREL.2005.07.081

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/SozzaDMGD05
A. Sozza, Christian Dua, Erwan Morvan, Bertrand Grimbert, Sylvain L. Delage:
A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications. Microelectron. Reliab. 45(9-11): 1617-1621 (2005)

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