


default search action
"Long-term reliability of Ti-Pt-Au metallization system for Schottky ..."
A. Sozza et al. (2004)
- A. Sozza
, Christian Dua, A. Kerlain, C. Brylinski, Enrico Zanoni
:
Long-term reliability of Ti-Pt-Au metallization system for Schottky contact and first-level metallization on SiC MESFET. Microelectron. Reliab. 44(7): 1109-1113 (2004)

manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.