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"Advantage of In-situ over Ex-situ techniques as reliability tool: Aging ..."

Philippe Soussan et al. (2003)

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DOI: 10.1016/S0026-2714(03)00301-9

access: closed

type: Journal Article

metadata version: 2021-10-14

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Philippe Soussan, G. Lekens, R. Dreesen, Ward De Ceuninck, Eric Beyne:
Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices. Microelectron. Reliab. 43(9-11): 1785-1790 (2003)

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