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"A study of an abnormal ESD failure mechanism and threshold voltage caused ..."

Yong-Ha Song et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.07.093

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/SongKPKSCKH04
Yong-Ha Song, Choong-Kyun Kim, Moo-Young Park, Bum-Suk Kye, Jeongil Seo, Dong-Soo Cho, Taek-Soo Kim, Gab-soo Han:
A study of an abnormal ESD failure mechanism and threshold voltage caused by ESD current zapping sequence. Microelectron. Reliab. 44(9-11): 1829-1834 (2004)

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