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"Impact of local structural and electrical properties of grain boundaries ..."
Kalya Shubhakar et al. (2014)
- Kalya Shubhakar, Nagarajan Raghavan
, Sunil Singh Kushvaha, Michel Bosman
, Zhongrui Wang
, Sean J. O'Shea, Kin Leong Pey
:
Impact of local structural and electrical properties of grain boundaries in polycrystalline HfO2 on reliability of SiOx interfacial layer. Microelectron. Reliab. 54(9-10): 1712-1717 (2014)
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