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"X-ray inspection of TSV defects with self-organizing map network and Otsu ..."

Junjie Shen et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.10.011

access: closed

type: Journal Article

metadata version: 2020-05-20

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Junjie Shen, Pengfei Chen, Lei Su, Tielin Shi, Zirong Tang, Guanglan Liao:
X-ray inspection of TSV defects with self-organizing map network and Otsu algorithm. Microelectron. Reliab. 67: 129-134 (2016)

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