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"Radiation Hardened by Design Latches - A Review and SEU Fault Simulations."

Faisal Mustafa Sajjade et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.02.017

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - journals/mr/SajjadeGVM18
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  - https://dblp.org/rec/journals/mr/SajjadeGVM18
Faisal Mustafa Sajjade, Neeraj Kumar Goyal, B. K. S. V. L. Varaprasad, Ravindra Moogina:
Radiation Hardened by Design Latches - A Review and SEU Fault Simulations. Microelectron. Reliab. 83: 127-135 (2018)

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