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"A Built-In Self-Test (BIST) system with non-intrusive TPG and ORA for FPGA ..."
Aiwu Ruan et al. (2013)
- Aiwu Ruan, Shi Kang, Yu Wang, Xiao Han, Zujian Zhu, Yongbo Liao, Peng Li:
A Built-In Self-Test (BIST) system with non-intrusive TPG and ORA for FPGA test and diagnosis. Microelectron. Reliab. 53(3): 488-498 (2013)
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