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"Series resistance and oxide thickness spread influence on Weibull ..."

David Roy et al. (2002)

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DOI: 10.1016/S0026-2714(02)00177-4

access: closed

type: Journal Article

metadata version: 2020-02-22

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David Roy, S. Bruyère, E. Vincent, Frederic Monsieur:
Series resistance and oxide thickness spread influence on Weibull breakdown distribution: New experimental correction for reliability projection improvement. Microelectron. Reliab. 42(9-11): 1497-1500 (2002)

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