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"Analysis of the effect of the gate oxide breakdown on SRAM stability."

Rosana Rodríguez et al. (2002)

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DOI: 10.1016/S0026-2714(02)00166-X

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/RodriguezSLKCJNBBL02
Rosana Rodríguez, James H. Stathis, Barry P. Linder, Steven P. Kowalczyk, Ching-Te Chuang, Rajiv V. Joshi, Gregory A. Northrop, Kerry Bernstein, Azeez J. Bhavnagarwala, Salvatore Lombardo:
Analysis of the effect of the gate oxide breakdown on SRAM stability. Microelectron. Reliab. 42(9-11): 1445-1448 (2002)

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