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"Impact of gate drive voltage on avalanche robustness of trench IGBTs."

Michele Riccio et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.07.028

access: closed

type: Journal Article

metadata version: 2021-10-14

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Michele Riccio, Luca Maresca, Andrea Irace, Giovanni Breglio, Yohei Iwahashi:
Impact of gate drive voltage on avalanche robustness of trench IGBTs. Microelectron. Reliab. 54(9-10): 1828-1832 (2014)

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