"Reliability assessment of 1.55-µm vertical cavity surface emitting ..."

Keun Ho Rhew et al. (2009)

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DOI: 10.1016/J.MICROREL.2008.10.008

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type: Journal Article

metadata version: 2020-02-22

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Keun Ho Rhew, Su Chang Jeon, Dae Hee Lee, Byueng-Su Yoo, Ilgu Yun:
Reliability assessment of 1.55-µm vertical cavity surface emitting lasers with tunnel junction using high-temperature aging tests. Microelectron. Reliab. 49(1): 42-50 (2009)

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