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"The impact of device width on the variability of post-irradiation leakage ..."
Nadia Rezzak et al. (2012)
- Nadia Rezzak, Pierre Maillard, Ronald D. Schrimpf
, Michael L. Alles, Daniel M. Fleetwood, Yanfeng Albert Li:
The impact of device width on the variability of post-irradiation leakage currents in 90 and 65 nm CMOS technologies. Microelectron. Reliab. 52(11): 2521-2526 (2012)
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