"Study on the degradation induced by donor interface state in ..."

Hongxia Ren, Yue Hao (2001)

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DOI: 10.1016/S0026-2714(00)00233-X

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type: Journal Article

metadata version: 2020-02-22

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Hongxia Ren, Yue Hao:
Study on the degradation induced by donor interface state in deep-sub-micron grooved-gate P-channel MOSFET's. Microelectron. Reliab. 41(4): 597-604 (2001)

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