"Three-dimensional nanometric sub-surface imaging of a silicon flip-chip ..."

Euan Ramsay et al. (2007)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2007.07.069

access: closed

type: Journal Article

metadata version: 2023-09-15

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/RamsaySTWWTR07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/RamsaySTWWTR07
Euan Ramsay, K. A. Serrels, M. J. Thomson, Andrew J. Waddie, Richard J. Warburton, Mohammed R. Taghizadeh, Derryck Telford Reid:
Three-dimensional nanometric sub-surface imaging of a silicon flip-chip using the two-photon optical beam induced current method. Microelectron. Reliab. 47(9-11): 1534-1538 (2007)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.