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"Three-dimensional nanometric sub-surface imaging of a silicon flip-chip ..."

Euan Ramsay et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.07.069

access: closed

type: Journal Article

metadata version: 2023-09-15

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Euan Ramsay, K. A. Serrels, M. J. Thomson, Andrew J. Waddie, Richard J. Warburton, Mohammed R. Taghizadeh, Derryck Telford Reid:
Three-dimensional nanometric sub-surface imaging of a silicon flip-chip using the two-photon optical beam induced current method. Microelectron. Reliab. 47(9-11): 1534-1538 (2007)

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